What's New In Alpha

Linked analysis

• rectangular brushing in scatter
• searchable test pickers across analysis surfaces
• parametric wafer heat map mode
• spatial analysis card with hotspot and regional selection controls
• explainable, permutation-calibrated wafer failure signatures with linked regions
• Lot Stack grouping of wafer-level signature families with combined selection
• linked selections across scatter, histogram, wafer, and spatial views

What-if review

• exact server-side impact review for scenario limit changes
• per-test and net yield deltas
• rescued and newly failing die counts
• top affected wafers
• CSV export from impact review

Collaboration and saved work

• saved version lineage via base_version
• read-only share-link opens
• document lifecycle states: active, archived, controlled
• improved shared-space access UX
• cleaner handling of no-access states

Analysis UX

• faster and more reliable scatter drag behavior
• better WebGPU fallback behavior
• rectangular wafer brushing and spatial overlays
• lot-stack spatial analysis workflow
• scatter and wafer context staying in sync better across cards and modals
• current Analyze lot, selection, and what-if limits can now flow into SQL helper views

Ingest correctness

• not executed PTR/MPR/FTR records no longer pollute stats
• ingest warns when test unit or res_scal metadata drifts across lots
• query-time test-name normalization can unify raw aliases under a canonical name

Future data domains

WAT/PCM, metrology, inspection, final-test, and equipment-stream support remains fixture-first discovery work. Stratum will not promise a generic CSV/Excel measurement model before representative customer exports establish each domain’s grain, identity, units, and coordinate semantics.