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- rectangular brushing in scatter
- searchable test pickers across analysis surfaces
- parametric wafer heat map mode
- spatial analysis card with hotspot and regional pushes
- linked selections across scatter, histogram, wafer, and spatial views
- exact server-side impact review for scenario limit changes
- per-test and net yield deltas
- rescued vs newly failing die counts
- top affected wafers
- CSV export from impact review
- saved version lineage via
base_version
- read-only share-link opens
- document lifecycle states: active, archived, controlled
- improved shared-space access UX
- cleaner handling of no-access states
- faster and more reliable scatter drag behavior
- better WebGPU fallback behavior
- rectangular wafer brushing and spatial overlays
- lot-stack spatial analysis workflow
- scatter and wafer context staying in sync better across cards and modals
- current Analyze lot, selection, and what-if limits can now waterfall into SQL helper views
not executed PTR/MPR/FTR records no longer pollute stats- ingest warns when test unit or
res_scal metadata drifts across lots
- query-time test-name normalization can unify raw aliases under a canonical name